By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics depend upon nanoscaled applied sciences that current new demanding situations when it comes to trying out and diagnostics. stories are relatively vulnerable to defects considering the fact that they make the most the know-how limits to get the top density. This booklet is a useful advisor to the trying out and diagnostics of the newest new release of SRAM, the most broadly utilized different types of reminiscence. Classical tools for checking out reminiscence are designed to address the so-called "static faults," yet those try options should not adequate for faults which are rising within the newest Very Deep Sub-Micron (VDSM) applied sciences. those new fault types, known as "dynamic faults", are usually not lined by way of classical try options and require the committed try out sequences offered during this book.
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Additional info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel